Yemane, Y. T., Sowa, M. J., Zhang, J., Ju, L., Deguns, E. W., Strandwitz, N.C., Prinz, F. B., Provine, J., "Superconducting niobium titanium nitride thin films deposited by plasma-enhanced atomic layer deposition," SUPERCONDUCTOR SCIENCE & TECHNOLOGY, Vol. 30, Issue 9, Article Number: 095010, SEP 2017
NbTiN has a variety of superconducting applications, ranging from RF cavities to single-photon detectors. Here, we systematically investigated the plasma-enhanced atomic layer deposition (PEALD) of NbxTi with the organometallic precursors (t-butylimido) tris(diethyamido) niobium(V) and tetrakis (dimethylamido) titanium in conjunction with a remote H2/N2 plasma. Deposited film properties have been studied as a function of the ratio of Nb to Ti precursor pulses within each ALD supercycle. PEALD NbTiN films were characterized with spectroscopic ellipsometry (thickness, optical properties), four point probe (resistivity), x-ray photoelectron spectroscopy (composition), x-ray reflectivity (density and thickness), x-ray diffraction (crystallinity), and superconductivity measurements. The PEALD process has shown distinct advantages over deposition of superconducting films via thermal ALD or sputtering, for example a lower processing temperature and more efficient control of film composition. This control of film composition enabled the tuning of electrical and superconducting properties, such as varying the superconducting critical temperature T C between 6.9 and 13.2 K.